公司简介
德国H+P SPECTROSCOPY公司专注于生产商品化的XUV光谱仪，可提供1nm-80nm的极紫外光谱仪。
技术能力
产品、定制、应用：
Characteristics flat-field grazing-incidence spectrograph proprietary H+P design for direct source imaging and maximum light collection
XUV wavelength range from 5 to 80 nm optional wavelength range 1 to 5 nm VUV version range 40 to 200 nm three different geometry options operating pressure <10^-6 mbar
modular, adaptable design turn-key, hassle-free operation
| Customization Our goal is to supply the perfect XUV / VUV spectrometer for your application. We customize every spectrometer to exactly match the desired application. This includes e.g.: interfacing to experimental chambers adaption of the source distance integration of customer-supplied detectors user-defined filter mounts
| Detection Our spectrometers can be operated with all state-of-the-art detection systems: x-ray CCD cameras for highest resolution, large dynamic range and absolute signal strength large-area MCPs for broadest wavelength coverage and gated / intensified detection
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Special solutions We offer specialized solution for almost every application, including:
| Applications
high harmonic generation (HHG) radiation high intensity laser-matter interaction undulator and free-electron-laser (FEL) radiation magnetically confined plasmas fusion research characterization of line-emission sources EUV source calibration
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性能参数
